[IEEE 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Angers (2017.9.4-2017.9.7)] 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE - SPICE model extraction for a MOSFET based on a parametric simulation and waveform measurement
Van Hoang, Thi Quynh, Yassuda-Yamashita, Daniela, Fernandez-Lopez, Priscila, Lafon, FredericYear:
2017
Language:
english
DOI:
10.1109/emceurope.2017.8094706
File:
PDF, 1.63 MB
english, 2017