[IEEE 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Angers (2017.9.4-2017.9.7)] 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Design and validation of a movable pin-contact miniature current probe for chip-level EMI noise measurement
Lin, Han-Nien, Hu, Che-Lun, Huang, Jen-Fu, Lin, Ming-Shan, Lin, Tsung-ChingYear:
2017
Language:
english
DOI:
10.1109/emceurope.2017.8094779
File:
PDF, 1.15 MB
english, 2017