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[IEEE 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Angers (2017.9.4-2017.9.7)] 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Impact of source current distribution patterns in on-chip interference studies
Novellas, Merce Grau, Serra, Ramiro, Rose, MatthiasYear:
2017
Language:
english
DOI:
10.1109/emceurope.2017.8094810
File:
PDF, 2.16 MB
english, 2017