[IEEE 2017 IEEE International Conference on Data Mining Workshops (ICDMW) - New Orleans, LA (2017.11.18-2017.11.21)] 2017 IEEE International Conference on Data Mining Workshops (ICDMW) - A Central Limit Theorem for an Omnibus Embedding of Multiple Random Dot Product Graphs
Levin, Keith, Athreya, Avanti, Tang, Minh, Lyzinski, Vince, Priebe, Carey E.Year:
2017
Language:
english
DOI:
10.1109/icdmw.2017.132
File:
PDF, 204 KB
english, 2017