[IEEE IECON 2017 - 43rd Annual Conference of the IEEE...

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[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Detailed EMT model and full-scale interface HIL test of hybrid MMC

Xu, Fei, Li, Zixin, Li, Yaohua, Wang, Ping, Shi, Liming, Gao, Fanqiang, Ma, Xun
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Year:
2017
Language:
english
DOI:
10.1109/iecon.2017.8216775
File:
PDF, 646 KB
english, 2017
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