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[IEEE 2017 American Control Conference (ACC) - Seattle, WA, USA (2017.5.24-2017.5.26)] 2017 American Control Conference (ACC) - Learning stable Gaussian process state space models
Umlauft, Jonas, Lederer, Armin, Hirche, SandraYear:
2017
Language:
english
DOI:
10.23919/ACC.2017.7963165
File:
PDF, 668 KB
english, 2017