[IEEE 2017 22nd Microoptics Conference (MOC) - Tokyo (2017.11.19-2017.11.22)] 2017 22nd Microoptics Conference (MOC) - Reliability analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment
Huang, Shen-Che, Li, Heng, Lee, Yu-Shan, Hung, Chen-Hao, Wang, Shing-Chung, Chen, Hsiang, Lu, Tien-ChangYear:
2017
Language:
english
DOI:
10.23919/MOC.2017.8244608
File:
PDF, 296 KB
english, 2017