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Investigation of Electron Transport Across Vertically Grown CNTs Using Combination of Proximity Field Emission Microscopy and Scanning Probe Image Processing Techniques
Kolekar, Sadhu, Patole, Shashikant P., Yoo, Ji-Beom, Dharmadhikari, Chandrakant V.Language:
english
Journal:
Electronic Materials Letters
DOI:
10.1007/s13391-018-0009-2
Date:
February, 2018
File:
PDF, 1.78 MB
english, 2018