![](/img/cover-not-exists.png)
A binary classification methodology applicable to defects detection. Boosting algorithms
Marie-Joseph, I., Oukaour, A., Clergeot, H., Primerose, A.Volume:
12
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2000172
Date:
October, 2000
File:
PDF, 763 KB
english, 2000