A binary classification methodology applicable to defects...

The European Physical Journal Applied Physics 2000 / 10 Vol. 12; Iss. 1

A binary classification methodology applicable to defects detection. Boosting algorithms

Marie-Joseph, I., Oukaour, A., Clergeot, H., Primerose, A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
12
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2000172
Date:
October, 2000
File:
PDF, 763 KB
english, 2000
Conversion to is in progress
Conversion to is failed