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[IEEE 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hsinchu (2017.10.18-2017.10.20)] 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Integration scheme for retention-aware DRAM refresh
Cheng, Wei-Kai, Li, Xin-Lun, Chen, Jian-KaiYear:
2017
Language:
english
DOI:
10.1109/EDSSC.2017.8126536
File:
PDF, 146 KB
english, 2017