![](/img/cover-not-exists.png)
[IEEE 2017 IEEE International Conference on Computer Vision Workshop (ICCVW) - Venice, Italy (2017.10.22-2017.10.29)] 2017 IEEE International Conference on Computer Vision Workshops (ICCVW) - A Content-Aware Metric for Stitched Panoramic Image Quality Assessment
Cheung, Gene, Yang, Luyu, Tan, Zhigang, Huang, ZheYear:
2017
Language:
english
DOI:
10.1109/ICCVW.2017.293
File:
PDF, 1.42 MB
english, 2017