Insight into the Mechanism of Tail Bits in Data Retention...

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IEEE Electron Device Letters 2018

Insight into the Mechanism of Tail Bits in Data Retention of Vacancy-Modulated Conductive Oxide RRAM

Koh, Sang-Gyu, Kurihara, Kazuaki, Belmonte, Attilio, Popovici, Mihaela Ioana, Donadio, Gabriele Luca, Goux, Ludovic, Kar, Gouri Sankar
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Year:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2810513
File:
PDF, 842 KB
english, 2018
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