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Probing the Critical Region of Conductive Filament in Nanoscale HfO 2 Resistive-Switching Device by Random Telegraph Signals
Chai, Zheng, Ma, Jigang, Zhang, Wei Dong, Govoreanu, Bogdan, Zhang, Jian Fu, Ji, Zhigang, Jurczak, MalgorzataVolume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2742578
Date:
October, 2017
File:
PDF, 6.84 MB
english, 2017