Angular Effects on Single-Event Mechanisms in Bulk FinFET Technologies
Nsengiyumva, Patrick, Massengill, Lloyd W., Kauppila, Jeffrey S., Maharrey, Jeffrey A., Harrington, Rachel C., Haeffner, Timothy D., Ball, Dennis R., Alles, Michael L., Bhuva, Bharat L., Holman, W. TiVolume:
65
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2775234
Date:
January, 2018
File:
PDF, 1.97 MB
english, 2018