[IEEE 11th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005] - Saint-Malo, France (2005.6.15-2005.6.17)] 11th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005] - On the accuracy of scattering measurements in free space: Random and systematic errors
Eyraud, Christelle, Geffrin, Jean-Michel, Sabouroux, PierreYear:
2005
Language:
english
DOI:
10.1109/antem.2005.7852069
File:
PDF, 16.36 MB
english, 2005