[IEEE 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hsinchu (2017.10.18-2017.10.20)] 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Impact of SOI thickness scaling on alpha-particle irradiation performance of MOSFETs
Aditya, Kritika, Saini, Rohit, Singh, Ramendra, Jha, Chandan Kumar, Dixit, AbhisekYear:
2017
Language:
english
DOI:
10.1109/edssc.2017.8126566
File:
PDF, 532 KB
english, 2017