[IEEE 2017 International Conference on Electron Devices and...

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[IEEE 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hsinchu (2017.10.18-2017.10.20)] 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Characterization and modeling of N-channel bulk FinFETs from DC to high frequency

Singh, Ramendra, Kushwaha, Pragya, Ghosh, Sudip, Parvais, Bertrand, Chauhan, Yogesh S., Dixit, Abhisek
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Year:
2017
Language:
english
DOI:
10.1109/edssc.2017.8126567
File:
PDF, 399 KB
english, 2017
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