[IEEE 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hsinchu (2017.10.18-2017.10.20)] 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Characterization and modeling of N-channel bulk FinFETs from DC to high frequency
Singh, Ramendra, Kushwaha, Pragya, Ghosh, Sudip, Parvais, Bertrand, Chauhan, Yogesh S., Dixit, AbhisekYear:
2017
Language:
english
DOI:
10.1109/edssc.2017.8126567
File:
PDF, 399 KB
english, 2017