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[IEEE 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Irvine, CA (2017.11.13-2017.11.16)] 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Towards reliability-aware circuit design in nanoscale FinFET technology: — New-generation aging model and circuit reliability simulator
Guo, Shaofeng, Wang, Runsheng, Yu, Zhuoqing, Hao, Peng, Ren, Pengpeng, Wang, Yangyuan, Liao, Siyu, Huang, Chunyi, Guo, Tianlei, Chen, Alvin, Xie, Jushan, Huang, RuYear:
2017
Language:
english
DOI:
10.1109/iccad.2017.8203856
File:
PDF, 860 KB
english, 2017