[IEEE 2017 IEEE 2nd International Conference on Opto-Electronic Information Processing (ICOIP) - Singapore, Singapore (2017.7.7-2017.7.9)] 2017 IEEE 2nd International Conference on Opto-Electronic Information Processing (ICOIP) - Electron trapping/detrapping model in electrically stressed oxide
Wang Hongyi,, Li Cong,, Zhang Bingbing,, Xu Shunqiang,, Zheng Liming,Year:
2017
Language:
english
DOI:
10.1109/optip.2017.8030699
File:
PDF, 3.84 MB
english, 2017