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[IEEE 2017 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C) - Prague, Czech Republic (2017.7.25-2017.7.29)] 2017 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C) - Improving Trace Generation and Analysis for Medical Devices
Blein, Yoann, Clere, Arnaud, Bertrand, Fabrice, Ledru, Yves, Groz, Roland, Bousquet, Lydie duYear:
2017
Language:
english
DOI:
10.1109/qrs-c.2017.135
File:
PDF, 134 KB
english, 2017