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A Mechanistic Analysis of Oxygen Vacancy Driven Conductive Filament Formation in Resistive Random Access Memory Metal/NiO/Metal Structures
Yildirim, Handan, Pachter, RuthLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.7b17645
Date:
February, 2018
File:
PDF, 4.15 MB
english, 2018