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[IEEE 2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - Haining, Hangzhou, China (2017.12.14-2017.12.16)] 2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - Modeling and characterization of polymer-embedded through-silicon vias (TSVs) in 3-D integrated circuits
Qu, Chenbing, Zhu, Zhangming, Yang, Yintang, Ding, Ruixue, Liu, Xiaoxian, Lu, Qijun, Yin, XiangkunYear:
2017
Language:
english
DOI:
10.1109/EDAPS.2017.8276981
File:
PDF, 706 KB
english, 2017