[IEEE 2017 IEEE 30th International Conference on...

  • Main
  • [IEEE 2017 IEEE 30th International...

[IEEE 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Nis (2017.10.9-2017.10.11)] 2017 IEEE 30th International Conference on Microelectronics (MIEL) - The prediction for single event latchup sensitivity parameters of digital CMOS ICs based on its technological features

Rudenkov, A.E., Akhmetov, A.O., Bobrovsky, D.V., Chumakov, A.I., Yanenko, A.V., Uzhegov, V.M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/MIEL.2017.8190123
File:
PDF, 844 KB
english, 2017
Conversion to is in progress
Conversion to is failed