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[IEEE 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Nis (2017.10.9-2017.10.11)] 2017 IEEE 30th International Conference on Microelectronics (MIEL) - The prediction for single event latchup sensitivity parameters of digital CMOS ICs based on its technological features
Rudenkov, A.E., Akhmetov, A.O., Bobrovsky, D.V., Chumakov, A.I., Yanenko, A.V., Uzhegov, V.M.Year:
2017
Language:
english
DOI:
10.1109/MIEL.2017.8190123
File:
PDF, 844 KB
english, 2017