[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Multimodal analysis of cultural heritage artefacts utilizing computed tomography and x-ray fluorescence imaging
Vavrik, Daniel, Jakubek, Jan, Lauterkranc, Jiri, Kumpova, Ivana, Vopalensky, Michal, Zemlicka, JanYear:
2016
Language:
english
DOI:
10.1109/NSSMIC.2016.8069960
File:
PDF, 877 KB
english, 2016