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[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - A study of accurate extraction of ESD parasitic capacitance
Chenkun Wang,, Fei Lu,, Rui Ma,, Qi Chen,, Feilong Zhang,, Cheng Li,, Yuhua Cheng,, Tianshen Tang,, Wang, AlbertYear:
2016
Language:
english
DOI:
10.1109/icsict.2016.7998944
File:
PDF, 861 KB
english, 2016