[IEEE 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Nis (2017.10.9-2017.10.11)] 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Power MOSFET single event burnout hardness increasing by neutron preirradiation
Kessarinskiy, L., Boychenko, D., Nikiforov, A., Polokhov, A., Kritskaya, T., Davydov, G.Year:
2017
Language:
english
DOI:
10.1109/miel.2017.8190093
File:
PDF, 420 KB
english, 2017