[IEEE 2017 IEEE International Test Conference (ITC) - Fort...

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[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter

Xu, Li, Zhuang, Yuming, Thinakaran, Rajavelu, Butler, Kenneth M., Chen, Degang
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Year:
2017
Language:
english
DOI:
10.1109/test.2017.8242057
File:
PDF, 1.10 MB
english, 2017
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