XEDS and EELS in the TEM at Atmospheric Pressure and High...

Microscopy and Microanalysis 2015 / 08 Vol. 21; Iss. S3

XEDS and EELS in the TEM at Atmospheric Pressure and High Temperature

Prestat, Eric, Smith, Matthew, Janssen, Arne, Slater, Thomas J. A., Camargo, Pedro H. C., Kulzick, Matthew A., Grace Burke, M., Haigh, Sarah J., Zaluzec, Nestor J.
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615002032
Date:
August, 2015
File:
PDF, 420 KB
english, 2015
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