Ultracompact ESD Protection With BIMOS-Merged Dual...

IEEE Transactions on Electron Devices 2017 / 10 Vol. 64; Iss. 10

Ultracompact ESD Protection With BIMOS-Merged Dual Back-to-Back SCR in Hybrid Bulk 28-nm FD-SOI Advanced CMOS Technology

Galy, Philippe, Bourgeat, Johan, Guitard, Nicolas, Lise, Jean-Daniel, Marin-Cudraz, David, Legrand, Charles-Alexandre
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2741524
Date:
October, 2017
File:
PDF, 4.11 MB
english, 2017
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