Correlative Atomic Force and Transmission Electron...

Microscopy and Microanalysis 2016 / 11 Vol. 22; Iss. S5

Correlative Atomic Force and Transmission Electron Microscopy toward Applications of Atomic Force Microscopy to Heterogeneous Systems

Yamada, Yutaro, Haruyama, Takamitsu, Shimabukuro, Katsuya, Konno, Hiroki
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616012241
Date:
November, 2016
File:
PDF, 150 KB
english, 2016
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