[IEEE 2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) - Hangzhou City, China (2016.10.26-2016.10.28)] 2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) - Enhanced-condition-MC/DC: A method for improving MC/DC testing adequacy
Yan, Haihua, Zhang, Xiaowei, Zhang, ZhenYear:
2016
Language:
english
DOI:
10.1109/ICRMS.2016.8050052
File:
PDF, 237 KB
english, 2016