[IEEE 2016 11th International Conference on Reliability,...

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[IEEE 2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) - Hangzhou City, China (2016.10.26-2016.10.28)] 2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) - Enhanced-condition-MC/DC: A method for improving MC/DC testing adequacy

Yan, Haihua, Zhang, Xiaowei, Zhang, Zhen
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Year:
2016
Language:
english
DOI:
10.1109/ICRMS.2016.8050052
File:
PDF, 237 KB
english, 2016
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