[IEEE 2017 IEEE 12th International Conference on ASIC (ASICON) - Guiyang (2017.10.25-2017.10.28)] 2017 IEEE 12th International Conference on ASIC (ASICON) - A novel layout automation flow to facilitate test chip design for standard cell characterization
Yang, Ludan, Pan, Weiwei, Shi, Zheng, Zheng, YongjunYear:
2017
Language:
english
DOI:
10.1109/ASICON.2017.8252418
File:
PDF, 463 KB
english, 2017