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[IEEE 2017 Devices for Integrated Circuit (DevIC) - Kalyani, India (2017.3.23-2017.3.24)] 2017 Devices for Integrated Circuit (DevIC) - Sub threshold analog &RF parameter extraction of graded channel gate stack DG-MOSFETs with high K material using NQS approach
Swain, Sanjit Kumar, Adak, Sarosij, Parija, Saradiya, Sarkar, Chandan KumarYear:
2017
Language:
english
DOI:
10.1109/DEVIC.2017.8073939
File:
PDF, 643 KB
english, 2017