[IEEE 2017 IEEE XXIV International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Cusco, Peru (2017.8.15-2017.8.18)] 2017 IEEE XXIV International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - BER reduction in OFDM systems susceptible to ICI using the exponential linear pulse
Zabala-Blanco, David, Campuzano, Gabriel, Azurdia-Meza, Cesar A.Year:
2017
Language:
english
DOI:
10.1109/INTERCON.2017.8079689
File:
PDF, 189 KB
english, 2017