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[IEEE 2017 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C) - Prague, Czech Republic (2017.7.25-2017.7.29)] 2017 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C) - Improving MC/DC and Fault Detection Strength Using Combinatorial Testing
Li, Dong, Hu, Linghuan, Gao, Ruizhi, Wong, W. Eric, Kuhn, D. Richard, Kacker, Raghu N.Year:
2017
Language:
english
DOI:
10.1109/QRS-C.2017.131
File:
PDF, 526 KB
english, 2017