Observation of Dislocation in a Silicon Single Crystal by...

Observation of Dislocation in a Silicon Single Crystal by X-Ray Plane Wave Topography

Takagi, Satio, Ishida, Kohtaro, Ootuka, Akio
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Volume:
45
Journal:
Journal of the Physical Society of Japan
DOI:
10.1143/JPSJ.45.1067
Date:
September, 1978
File:
PDF, 547 KB
1978
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