Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2018 / 05 Vol. 36; Iss. 3
ToF-SIMS and other surface spectroscopies applied to the study of ancient artifacts: Preliminary investigation of a tetradrachm of Claudius
Sodhi, Rana N. S., Brodersen, Peter, Boccia, Sal, Anastassiades, Amandina, Zaccagnino, CristianaVolume:
36
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.5013613
Date:
May, 2018
File:
PDF, 7.65 MB
english, 2018