![](/img/cover-not-exists.png)
Resistive switching characteristics of interfacial phase-change memory at elevated temperature
Mitrofanov, Kirill V., Saito, Yuta, Miyata, Noriyuki, Fons, Paul, Kolobov, Alexander V., Tominaga, JunjiVolume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.04FE06
Date:
April, 2018
File:
PDF, 2.02 MB
english, 2018