Advanced analytical modeling of double-gate Tunnel-FETs – A...

Solid-State Electronics 2018 / 03 Vol. 141

Advanced analytical modeling of double-gate Tunnel-FETs – A performance evaluation

Graef, Michael, Hosenfeld, Fabian, Horst, Fabian, Farokhnejad, Atieh, Hain, Franziska, Iñíguez, Benjamín, Kloes, Alexander
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Volume:
141
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2017.11.009
Date:
March, 2018
File:
PDF, 1.31 MB
english, 2018
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