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[IEEE 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS) - Dubai (2017.12.18-2017.12.20)] 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS) - Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing
Ahmad, AfaqYear:
2017
Language:
english
DOI:
10.1109/ICTUS.2017.8285976
File:
PDF, 435 KB
english, 2017