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Electrical and impedance properties of MPS structure based on (Cu2O–CuO–PVA) interfacial layer

Buyukbas-Uluşan, A., Yerişkin, S. Altındal, Tataroğlu, A., Balbaşı, M., Kalandaragh, Y. Azizian
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Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-018-8830-9
Date:
February, 2018
File:
PDF, 1.63 MB
english, 2018
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