[IEEE 2017 IEEE International Conference on Computer Vision Workshop (ICCVW) - Venice (2017.10.22-2017.10.29)] 2017 IEEE International Conference on Computer Vision Workshops (ICCVW) - Simple Triplet Loss Based on Intra/Inter-Class Metric Learning for Face Verification
Ming, Zuheng, Chazalon, Joseph, Luqman, Muhammad Muzzamil, Visani, Muriel, Burie, Jean-ChristopheYear:
2017
Language:
english
DOI:
10.1109/ICCVW.2017.194
File:
PDF, 2.69 MB
english, 2017