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[IEEE 2017 IEEE International Conference on Computer Vision Workshop (ICCVW) - Venice (2017.10.22-2017.10.29)] 2017 IEEE International Conference on Computer Vision Workshops (ICCVW) - Simple Triplet Loss Based on Intra/Inter-Class Metric Learning for Face Verification

Ming, Zuheng, Chazalon, Joseph, Luqman, Muhammad Muzzamil, Visani, Muriel, Burie, Jean-Christophe
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Year:
2017
Language:
english
DOI:
10.1109/ICCVW.2017.194
File:
PDF, 2.69 MB
english, 2017
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