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[IEEE 2017 IEEE XXIV International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Cusco, Peru (2017.8.15-2017.8.18)] 2017 IEEE XXIV International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Framework for automated tests of LTE physical layers
de Figueiredo, Felipe A. P., Mathilde, Fabiano, Pizzini, Luiz R., Figueiredo, Fabricio, Carrillo, Dick, Moerman, IngridYear:
2017
Language:
english
DOI:
10.1109/INTERCON.2017.8079693
File:
PDF, 274 KB
english, 2017