A General Line-Line Method for Dielectric Material Characterization Using Conductors With the Same Cross-Sectional Geometry
Bao, Xiue, Liu, Song, Ocket, Ilja, Bao, Juncheng, Schreurs, Dominique, Zhang, Shengkang, Cheng, Chunyue, Feng, Keming, Nauwelaers, BartYear:
2018
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/LMWC.2018.2809041
File:
PDF, 678 KB
english, 2018