Single-Event Transient Susceptibility Analysis and Evaluation Methodology for Clock Distribution Network in the Integrated Circuit Working in Real Time
Hao, Peipei, Chen, ShumingVolume:
17
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2017.2733218
Date:
September, 2017
File:
PDF, 1.97 MB
english, 2017