A Reliable Strong PUF Based on Switched-Capacitor Circuit
He, Zhangqing, Wan, Meilin, Deng, Jie, Bai, Chuang, Dai, KuiYear:
2018
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2018.2806041
File:
PDF, 2.07 MB
english, 2018