Topological Sensitivity for Solving Inverse Multiple...

SIAM Journal on Imaging Sciences 2018 / 01 Vol. 11; Iss. 1

Topological Sensitivity for Solving Inverse Multiple Scattering Problems in Three-Dimensional Electromagnetism. Part II: Iterative Method

Le Louër, Frédérique, Rapún, María-Luisa
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Volume:
11
Language:
english
Journal:
SIAM Journal on Imaging Sciences
DOI:
10.1137/17M1148359
Date:
January, 2018
File:
PDF, 5.41 MB
english, 2018
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