![](/img/cover-not-exists.png)
In-Situ Creep Testing Capability for the Advanced Test Reactor
Kim, Bong Goo, Rempe, Joy L., Knudson, Darrell L., Condie, Keith G., Sencer, Bulent H.Volume:
179
Language:
english
Journal:
Nuclear Technology
DOI:
10.13182/nt12-a14173
Date:
September, 2012
File:
PDF, 737 KB
english, 2012