Reduction in the write error rate of voltage-induced...

Japanese Journal of Applied Physics 2018 / 04 Vol. 57; Iss. 4

Reduction in the write error rate of voltage-induced dynamic magnetization switching using the reverse bias method

Ikeura, Takuro, Nozaki, Takayuki, Shiota, Yoichi, Yamamoto, Tatsuya, Imamura, Hiroshi, Kubota, Hitoshi, Fukushima, Akio, Suzuki, Yoshishige, Yuasa, Shinji
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Volume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.040311
Date:
April, 2018
File:
PDF, 617 KB
english, 2018
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