![](/img/cover-not-exists.png)
[IEEE 2017 13th IEEE Conference on Automation Science and Engineering (CASE 2017) - Xi'an (2017.8.20-2017.8.23)] 2017 13th IEEE Conference on Automation Science and Engineering (CASE) - Modeling collinear WATs for parametric yield enhancement in semiconductor manufacturing
Chien, Chen-Fu, Lee, Peng-Chieh, Dou, Runliang, Chen, Ying-Jen, Chen, Chia-ChengYear:
2017
Language:
english
DOI:
10.1109/COASE.2017.8256192
File:
PDF, 796 KB
english, 2017